Comparing functional and structural tests

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 400-407

  Maxwell, Peter ^a   Hartanto, Ismed ^a   Bentz, Lee ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BUILT-IN SELF TEST; COST EFFECTIVENESS; FLIP FLOP CIRCUITS; MICROPROCESSOR CHIPS; PHASE LOCKED LOOPS;

FUNCTIONAL TESTS; LOW COST TESTERS; STRUCTURAL BASED TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0034481609     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)