Hardware acceleration alone will not make fault grading ULSI a reality

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 848-857

  Ganapathy, Gopi ^a   Abraham, Jacob A ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; COMPUTER SIMULATION; ULSI CIRCUITS;

DETERMINISTIC FAULTS; PARTITIONING SCHEMES;

INTEGRATED CIRCUIT TESTING;

EID: 0026618763     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)