Multidimensional scaling of solid-state parameters with plasmon energy and in-situ spectro-microscopic determination and imaging of material properties

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1192-1193

  Oleshko, V P ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750863186     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606068334     Document Type: Conference Paper

References (11)

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6. V. P. Oleshko, J. M. Howe, in: Mater. Res. Soc. Symp. Proc. Ser. Vol. 791, Warrendale, PA, 2004, Q9.5.1;
7. Mater. Res. Soc. Symp. Proc. Ser. Vol. i bid Vol. 839, 2005, P2.11.1.
8. J.M. Howe, V.P. Oleshko, J. Electron Microsc. 53 (2004) 339.
9. J. Robertson, in: Diamond and Diamond-Like Films and Coatings, NATO ASI Ser. B. Vol. 266, N.Y., 1991, 331.
10. J.T. Titantah, D. Lamoen, Phys. Rev. B 70 (2004) 033101-1.
11. This research was supported by the US Department of Energy (Grant No. DE-FG02-01ER45918).