High spatial resolution analytical electron microscopic investigation of femtosecond-laser-induced crystallization of a-Si:H films

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 634-635

  Oleshko, V P ^a   Nayak, B K ^a   Gupta, M C ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750853052     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606066050     Document Type: Conference Paper

References (12)

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12. Authors acknowledge the support from the NSF, grant ECS-0100243 (BKN and MCG) and from the DOE, contract DE-FG02-01ER45918 (VPO). We also thank Dr. Yuan-Min Li of EPV Corp., NJ for providing a-Si:H films.