Valence electron energy-loss spectroscopy as a tool for in situ diagnostics of materials properties

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 918-919

  Oleshko, Vladimir P ^a   Howe, James M ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041419593     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444590     Document Type: Conference Paper

References (7)

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5. J.H. Rose et al., Phys. Rev. 29(6) (1984) 2963.
6. A. Banerjea, J.R. Smith, Phys. Rev. 37(12) (1988) 6632.
7. V.L. Moruzzi et al., Calculated Electronic Properties of Metals, Pergamon, NY, 1978.