Nonlinear dynamic perspectives on dynamic force microscopy

Ultramicroscopy

Volumn 97, Issue 1-4, 2003, Pages 185-198

  Lee, S I ^a   Howell, S W ^a   Raman, A ^a   Reifenberger, R ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

Bifurcation; Dynamic force microscopy; Nonlinear dynamics; Tapping mode

Indexed keywords

DYNAMIC RESPONSE; FREQUENCIES; GRAPHITE; MICROSCOPIC EXAMINATION; VAN DER WAALS FORCES;

DYNAMIC FORCE MICROSCOPY;

NANOSTRUCTURED MATERIALS;

GRAPHITE;

ANALYTIC METHOD; ARTICLE; DYNAMIC FORCE MICROSCOPY; DYNAMICS; FORCE; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; MICROSCOPY; NONLINEAR SYSTEM; PREDICTION; SURFACE PROPERTY; THEORY;

EID: 0037865719     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00043-3     Document Type: Article

References (28)

1. Haugstad G., Jones R.R. Ultramicroscopy. 76:1999;77.
2. Lantz M., Liu Y.Z., Cui X.D., Tokumoto H., Linsay S.M. Surf. Interface Anal. 27:1999;354.
3. de Pablo P.J., Colchero J., Luna M., Gómez-Herrero J., Baró A.M. Phys. Rev. B. 61:2000;14179.
4. Chen X., Davies M.C., Roberts C.J., Tendler S.J.B., Williams P.M., Burnham N.A. Surf. Sci. 460:2000;292.
5. San Paulo A., García R. Biophys. J. 78:2000;1599.
6. García R., San Paulo A. Phys. Rev. B. 61:2000;R13381.
7. García R., San Paulo A. Ultramicroscopy. 82:2000;79.
8. Anczykowski B., Krüger D., Babcock K.L., Fuchs H. Ultramicroscopy. 66:1996;251.
9. Nony L., Boisgard R., Aimé J.-P. Eur. Phys. J. B. 24:2001;221.
10. Gleyzes P., Kuo P.K., Boccara A.C. Appl. Phys. Lett. 58:1991;2989.
11. Kühle A., S ø rensen A.H. J. Bohr, J. Appl. Phys. 81:1997;6562.
12. García R., San Paulo A. Phys. Rev. B. 60:1999;4961.
13. Marth M., Maier D., Honerkamp J., Brandsch R., Bar G. J. Appl. Phys. 85:1999;7030.
14. Derjaguin B.V., Muller V.M., Toporov Y.P., Colloid J. Interface Sci. 53:1975;314.
15. Rabe U., Janser K., Arnold W. Rev. Sci. Inst. 67:1996;3201.
16. Meirovitch L. Principles and Techniques of Vibrations. 1997;Prentice-Hall, Englewood Cliffs, NJ.
17. Ulcinas A., Snitka V. Ultramicroscopy. 86:2001;217.
18. van de Water W., Molenaar J. Nanotechnology. 11:2000;592.
19. Salapaka M.V., Chen D.J., Cleveland J.P. Phys. Rev. B. 61:2000;1106.
20. Kühle A., S ø rensen A.H., Zandbergen J.B., Bohr J. Appl. Phys. A. 66:1998;S329.
21. San Paulo A., García R. Phys. Rev. B. 64:2001;193411.
22. Gauthier M., Sasaki N., Tsukada M. Phys. Rev. B. 64:2001;085409.
23. Gotsmann B., Fuchs H. Phys. Rev. Lett. 86:2001;2597.
24. Sarid D. Scanning Force Microscopy: with Applications to Electric, Magnetic and Atomic Forces. 1991;Oxford University Press, Oxford.
25. Israelachvili J. Intermolecular and Surface Forces. 1992;Academic Press, New York.
26. Guckenheimer J., Holmes P. Nonlinear Oscillations, Dynamical Systems and Bifurcations of Vector Fields. 1991;Springer, Berlin.
27. Lee S.I., Howell S.W., Raman A., Reifenberger R. Phys. Rev. B. 66:2002;115409.
28. Burnham N.A., Kulik A.J., Gremaud G., Briggs G.A.D. Phys. Rev. Lett. 74:1995;5092.