Parametric resonance based scanning probe microscopy

Applied Physics Letters

Volumn 88, Issue 19, 2006, Pages

  Moreno Moreno, M ^a   Raman, A ^b   Gomez Herrero, J ^a   Reifenberger, R ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FORCE SPECTROSCOPY; PARAMETRIC PUMPING; PARAMETRIC RESONANCE; SENSITIVE NANOSCALE IMAGING;

BANDWIDTH; IMAGING TECHNIQUES; NETWORKS (CIRCUITS); OPTICAL MICROSCOPY; SPECTROSCOPIC ANALYSIS;

RESONANCE;

EID: 33646699523     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2202132     Document Type: Article

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