Imaging layer number and stacking order through formulating Raman fingerprints obtained from hexagonal single crystals of few layer graphene

Nanotechnology

Volumn 24, Issue 1, 2013, Pages

  Hwang, Jih Shang ^a   Lin, Yu Hsiang ^a   Hwang, Jeong Yuan ^b   Chang, Railing ^a   Chattopadhyay, Surojit ^c   Chen, Chang Jiang ^a   Chen, Peilin ^d   Chiang, Hai Pang ^a   Tsai, Tsong Ru ^a   Chen, Li Chyong ^b   Chen, Kuei Hsien ^b,e  

^a NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c NATIONAL YANG MING UNIVERSITY   (Taiwan)

^d RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^e INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AREA RATIOS; FEW-LAYER GRAPHENE; GRAPHENE GROWTH; GRAPHENE LAYERS; HIGH MOBILITY; HIGH QUALITY; LAYER NUMBER; MASS PRODUCTION; MONITORING AND CONTROL; PEAK AREA RATIOS; QUANTITATIVE MAPPING; STACKING ORDER; TURBOSTRATIC;

ELECTRON MOBILITY; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHENE;

EID: 84870495701     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/1/015702     Document Type: Article

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