Raman scattering at pure graphene zigzag edges

Nano Letters

Volumn 10, Issue 11, 2010, Pages 4544-4548

  Krauss, Benjamin ^a   Nemes Incze, Péter ^b   Skakalova, Viera ^a   Biro, László P ^b   Klitzing, Klaus Von ^a   Smet, Jurgen H ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

anisotropic etching; Graphene; Raman spectroscopy; zigzag edges

Indexed keywords

CARBOTHERMAL DECOMPOSITION; CONFOCAL RAMAN SPECTROSCOPY; CRYSTALLOGRAPHIC DIRECTIONS; GRAPHENE DEVICES; GRAPHENES; PURE EDGE; ZIGZAG EDGES;

ANISOTROPY; CHIRALITY; ENANTIOMERS; GRAPHENE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICON COMPOUNDS; STEREOCHEMISTRY;

ANISOTROPIC ETCHING;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; LIGHT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; RADIATION SCATTERING; RAMAN SPECTROMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; LIGHT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MODELS, CHEMICAL; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SCATTERING, RADIATION; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 78449310017     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl102526s     Document Type: Article

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