High-throughput large-area automated identification and quality control of graphene and few-layer graphene films

ACS Nano

Volumn 5, Issue 2, 2011, Pages 914-922

  Nolen, Craig M ^a   Denina, Giovanni ^b   Teweldebrhan, Desalegne ^a   Bhanu, Bir ^b   Balandin, Alexander A ^a  

^a Biomedical Engineering Program   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

graphene identification; graphene industrial applications; graphene quality control; image processing; Raman nanometrology

Indexed keywords

ATOMIC PLANES; AUTOMATED APPROACH; AUTOMATED IDENTIFICATION; BACKGROUND SUBTRACTION; EPITAXIAL GRAPHENE; HIGH-THROUGHPUT; HIGH-THROUGHPUT METHOD; IN-SITU; INDUSTRIAL SCALE; MICRO-RAMAN; NONUNIFORMITY CORRECTION; OPTICAL MICROSCOPES; ORIGINAL IMAGES; PSEUDO-COLORS; RAMAN NANOMETROLOGY; SINGLE LAYER; VARIOUS SUBSTRATES;

GRAPHENE; IDENTIFICATION (CONTROL SYSTEMS); IMAGE PROCESSING; IMAGING SYSTEMS; INDUSTRIAL APPLICATIONS; INDUSTRY; OPTICAL DATA PROCESSING; QUALITY ASSURANCE; SUBSTRATES;

QUALITY CONTROL;

EID: 79951882127     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn102107b     Document Type: Article

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