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Volumn 3, Issue 2, 2010, Pages 110-116

Crystallographically selective nanopatterning of graphene on SiO2

Author keywords

Atomic force microscopy (AFM); Etching; Graphene; Nanoribbon; Zigzag

Indexed keywords


EID: 77949285602     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-010-1015-3     Document Type: Article
Times cited : (92)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.