SCOPUS 정보 검색 플랫폼

Journal of Electron Spectroscopy and Related Phenomena

Volumn 185, Issue 10, 2012, Pages 417-428

Recent advances in imaging of properties and growth of low dimensional structures for photonics and electronics by XPEEM

(3) Zakharov, A A a A mikkelsen, a Andersen, J N a

a LUND UNIVERSITY (Sweden)

Author keywords

Droplet dynamics; Graphene; Nanowires; Short pulse laser; XPEEM

Indexed keywords

CHEMICAL ANALYSIS; DROPS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; GALLIUM PHOSPHIDE; GRAPHENE; III-V SEMICONDUCTORS; INTERCALATION; LIGHT SOURCES; NANOWIRES; PHOTOEMISSION; SILICON CARBIDE; SILICON COMPOUNDS; SURFACE CHEMISTRY; WIDE BAND GAP SEMICONDUCTORS; X RAYS;

DROPLET DYNAMICS; LOW DIMENSIONAL STRUCTURE; LOW ENERGY ELECTRON MICROSCOPY; NANOSTRUCTURE FABRICATION; PHOTOELECTRON DIFFRACTION; PHOTOEMISSION ELECTRON MICROSCOPY; SHORT-PULSE LASERS; XPEEM;

SUBSTRATES;

EID: 84870054870 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2012.03.002 Document Type: Article

Times cited : (19)

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