Low temperature Ga surface diffusion from focused ion beam milled grooves

Nanotechnology

Volumn 20, Issue 32, 2009, Pages

  Mikkelsen, A ^a   Hilner, E ^a   Andersen, J N ^a   Ghatnekar Nilsson, S ^a   Montelius, L ^a   Zakharov, A A ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-SCALE MODEL; GA DIFFUSION; LOW TEMPERATURES; MIRROR ELECTRON MICROSCOPIES; MORPHOLOGICAL DEFECTS; REGULAR PATTERNS; SILANOL GROUPS; THIN LAYERS; X-RAY-PHOTO-EMISSION ELECTRON MICROSCOPIES;

DIFFUSION IN SOLIDS; FOCUSED ION BEAMS; SURFACE CHEMISTRY; SURFACE DEFECTS;

SURFACE DIFFUSION;

GALLIUM;

ARTICLE; DIFFUSION; ELECTRON MICROSCOPY; LASER; LOW TEMPERATURE; OXIDATION; PRIORITY JOURNAL; SPECTROSCOPY;

EID: 70249127234     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/32/325304     Document Type: Article

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