Correlated field evaporation as seen by atom probe tomography

Surface Science

Volumn 601, Issue 2, 2007, Pages 536-543

  De Geuser, Frédéric ^a,b   Gault, Baptiste ^a   Bostel, Alain ^a   Vurpillot, François ^a  

^a CNRS   (France)

^b ALCAN INTERNATIONAL LIMITED   (Canada)

Author keywords

Atom probe tomography; Field evaporation; Simulation

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; TOMOGRAPHY;

ATOM PROBE TOMOGRAPHY; FIELD EVAPORATION;

EVAPORATION;

EID: 33846061166     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.10.019     Document Type: Article

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