Poole-Frenkel emission in epitaxial nickel oxide on AlGaN/GaN heterostructures

Applied Physics Letters

Volumn 101, Issue 17, 2012, Pages

  Fiorenza, Patrick ^a   Greco, Giuseppe ^a,b   Giannazzo, Filippo ^a   Lo Nigro, Raffaella ^a   Roccaforte, Fabrizio ^a  

^a CNR IMM   (Italy)

^b SCUOLA SUPERIORE DI CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN/GAN HETEROSTRUCTURES; CONDUCTION MECHANISM; CONDUCTIVE-ATOMIC FORCE; CURRENT SPOTS; CURRENT-VOLTAGE MEASUREMENTS; DIELECTRIC LAYER; EMISSION BARRIER; MICROSCOPIC MEASUREMENT; POOLE-FRENKEL; POOLE-FRENKEL EMISSION;

DIELECTRIC FILMS; EPITAXIAL GROWTH; GALLIUM NITRIDE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SURFACE DEFECTS;

NICKEL OXIDE;

EID: 84868022930     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4761961     Document Type: Article

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