Nanoscale carrier transport in Ti/Al/Ni/Au Ohmic contacts on AlGaN epilayers grown on Si(111)

Applied Physics Letters

Volumn 89, Issue 2, 2006, Pages

  Roccaforte, F ^a   Iucolano, F ^a   Giannazzo, F ^a   Alberti, A ^a   Raineri, V ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; STRUCTURAL ANALYSIS; TITANIUM; X RAY DIFFRACTION ANALYSIS;

CONDUCTIVE-ATOMIC FORCE MICROSCOPY; NANOSCALE CARRIER TRANSPORT; TI/AL/NI/AU OHMIC CONTACTS;

OHMIC CONTACTS;

EID: 33746056864     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2220486     Document Type: Article

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