-
1
-
-
77952867711
-
-
edited by F. Ren and J. C. Zolper (World Scientific, Singapore).
-
Wide Band Gap Electronic Devices, edited by, F. Ren, and, J. C. Zolper, (World Scientific, Singapore, 2003).
-
(2003)
Wide Band Gap Electronic Devices
-
-
-
2
-
-
0001590229
-
-
10.1063/1.369664
-
O. Ambacher, J. Smart, J. R. Shealy, N. G. Weimann, K. Chu, M. Murphy, W. J. Schaff, L. F. Eastman, R. Dimitrov, L. Wittmer, M. Stutzmann, W. Rieger, and J. Hilsenbeck, J. Appl. Phys. 85, 3222 (1999). 10.1063/1.369664
-
(1999)
J. Appl. Phys.
, vol.85
, pp. 3222
-
-
Ambacher, O.1
Smart, J.2
Shealy, J.R.3
Weimann, N.G.4
Chu, K.5
Murphy, M.6
Schaff, W.J.7
Eastman, L.F.8
Dimitrov, R.9
Wittmer, L.10
Stutzmann, M.11
Rieger, W.12
Hilsenbeck, J.13
-
3
-
-
67649965915
-
-
10.1002/pssa.200880968
-
M. Yanagihara, Y. Uemoto, T. Ueda, T. Tanaka, and D. Ueda, Phys. Status Solidi A 206, 1221 (2009). 10.1002/pssa.200880968
-
(2009)
Phys. Status Solidi A
, vol.206
, pp. 1221
-
-
Yanagihara, M.1
Uemoto, Y.2
Ueda, T.3
Tanaka, T.4
Ueda, D.5
-
4
-
-
67649910139
-
-
10.1002/pssa.200880983
-
T. Kikkawa, K. Makiyama, T. Ohku, M. Kanamura, K. Imanishi, N. Hara, and K. Joshin, Phys. Status Solidi A 206, 1135 (2009). 10.1002/pssa.200880983
-
(2009)
Phys. Status Solidi A
, vol.206
, pp. 1135
-
-
Kikkawa, T.1
Makiyama, K.2
Ohku, T.3
Kanamura, M.4
Imanishi, K.5
Hara, N.6
Joshin, K.7
-
5
-
-
12344314332
-
High-voltage normally off GaN MOSFETs on sapphire substrates
-
DOI 10.1109/TED.2004.841355
-
K. Matocha, T. P. Chow, and R. J. Gutmann, IEEE Trans. Electron Dev. 52, 6 (2005). 10.1109/TED.2004.841355 (Pubitemid 40118904)
-
(2005)
IEEE Transactions on Electron Devices
, vol.52
, Issue.1
, pp. 6-10
-
-
Matocha, K.1
Chow, T.P.2
Gutmann, R.J.3
-
6
-
-
71949121182
-
-
10.1063/1.3268474
-
Z. H. Liu, G. I. Ng, S. Arulkumaran, Y. K. T. Maung, K. L. Teo, S. C. Foo, and V. Sahmuganathan, Appl. Phys. Lett. 95, 223501 (2009). 10.1063/1.3268474
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 223501
-
-
Liu, Z.H.1
Ng, G.I.2
Arulkumaran, S.3
Maung, Y.K.T.4
Teo, K.L.5
Foo, S.C.6
Sahmuganathan, V.7
-
7
-
-
0000886283
-
-
10.1063/1.371392
-
J.-K. Ho, C.-S. Jong, C. C. Chiu, C.-N. Huang, K.-K. Shin, L.-C. Chen, F.-R. Chen, and J.-J. Kai, J. Appl. Phys. 86, 4491 (1999). 10.1063/1.371392
-
(1999)
J. Appl. Phys.
, vol.86
, pp. 4491
-
-
Ho, J.-K.1
Jong, C.-S.2
Chiu, C.C.3
Huang, C.-N.4
Shin, K.-K.5
Chen, L.-C.6
Chen, F.-R.7
Kai, J.-J.8
-
8
-
-
20844439094
-
Characterization of sputtered NiO thin films
-
DOI 10.1016/j.surfcoat.2004.10.032, PII S0257897204010229
-
H.-L. Chen, Y.-M. Lu, and W.-S. Hwang, Surf. Coat. Technol. 198, 138 (2005). 10.1016/j.surfcoat.2004.10.032 (Pubitemid 40864538)
-
(2005)
Surface and Coatings Technology
, vol.198
, Issue.1-3 SPEC. ISS.
, pp. 138-142
-
-
Chen, H.-L.1
Lu, Y.-M.2
Hwang, W.-S.3
-
9
-
-
10044257807
-
-
10.1063/1.1811793
-
C. S. Oh, C. J. Youn, G. M. Yang, K. Y. Lim, and J. W. Yang, Appl. Phys. Lett. 85, 4214 (2004). 10.1063/1.1811793
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 4214
-
-
Oh, C.S.1
Youn, C.J.2
Yang, G.M.3
Lim, K.Y.4
Yang, J.W.5
-
10
-
-
0142121628
-
-
10.1063/1.1610248
-
H. C. Kang, S. H. Seo, H. W. Jang, D. H. Kim, and D. Y. Noh, Appl. Phys. Lett. 83, 2139 (2003). 10.1063/1.1610248
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 2139
-
-
Kang, H.C.1
Seo, S.H.2
Jang, H.W.3
Kim, D.H.4
Noh, D.Y.5
-
11
-
-
84855335975
-
-
10.1063/1.3669407
-
G. Greco, P. Prystawko, M. Leszczyski, R. Lo Nigro, V. Raineri, and F. Roccaforte, J. Appl. Phys. 110, 123703 (2011). 10.1063/1.3669407
-
(2011)
J. Appl. Phys.
, vol.110
, pp. 123703
-
-
Greco, G.1
Prystawko, P.2
Leszczyski, M.3
Lo Nigro, R.4
Raineri, V.5
Roccaforte, F.6
-
12
-
-
33144476337
-
2· tmeda to MOCVD of nickel oxide thin films
-
DOI 10.1039/b511317b
-
G. Malandrino, L. M. S. Perdicaro, G. G. Condorelli, I. L. Fragal, P. Rossi, and P. Dapporto, Dalton Trans. Issue 8, 1101 (2006). 10.1039/b511317b (Pubitemid 43263087)
-
(2006)
Dalton Transactions
, Issue.8
, pp. 1101-1106
-
-
Malandrino, G.1
Perdicaro, L.M.S.2
Condorelli, G.3
Fragala, I.L.4
Rossi, P.5
Dapporto, P.6
-
13
-
-
33947428831
-
MOCVD template approach to the fabrication of free-standing nickel(II) oxide nanotube arrays: Structural, morphological, and optical properties characterization
-
DOI 10.1021/jp067696o
-
G. Malandrino, L. M. S. Perdicaro, I. L. Fragal, R. Lo Nigro, M. Losurdo, and G. Bruno, J. Phys. Chem. C 111, 3211 (2007). 10.1021/jp067696o (Pubitemid 46456211)
-
(2007)
Journal of Physical Chemistry C
, vol.111
, Issue.8
, pp. 3211-3215
-
-
Malandrino, G.1
Perdicaro, L.M.S.2
Fragala, I.L.3
Nigro, R.L.4
Losurdo, M.5
Bruno, G.6
-
14
-
-
33746056864
-
Nanoscale carrier transport in Ti/Al/Ni/Au Ohmic contacts on AlGaN epilayers grown on Si(111)
-
DOI 10.1063/1.2220486
-
F. Roccaforte, F. Iucolano, F. Giannazzo, A. Alberti, and V. Raineri, Appl. Phys. Lett. 89, 022103 (2006). 10.1063/1.2220486 (Pubitemid 44079061)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.2
, pp. 022103
-
-
Roccaforte, F.1
Iucolano, F.2
Giannazzo, F.3
Alberti, A.4
Raineri, V.5
-
15
-
-
56349117212
-
-
10.1063/1.3006133
-
F. Iucolano, F. Roccaforte, F. Giannazzo, and V. Raineri, J. Appl. Phys. 104, 093706 (2008). 10.1063/1.3006133
-
(2008)
J. Appl. Phys.
, vol.104
, pp. 093706
-
-
Iucolano, F.1
Roccaforte, F.2
Giannazzo, F.3
Raineri, V.4
-
17
-
-
0035938335
-
-
10.1063/1.1367275
-
S. P. Grabowski, M. Schneider, H. Nienhaus, W. Mönch, R. Dimitrov, O. Ambacher, and M. Stutzmann, Appl. Phys. Lett. 78, 2503 (2001). 10.1063/1.1367275
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 2503
-
-
Grabowski, S.P.1
Schneider, M.2
Nienhaus, H.3
Mönch, W.4
Dimitrov, R.5
Ambacher, O.6
Stutzmann, M.7
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