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Volumn 100, Issue 6, 2012, Pages

Epitaxial NiO gate dielectric on AlGaN/GaN heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN/GAN; ALGAN/GAN HETEROSTRUCTURES; FILM QUALITY; METAL-INSULATOR-SEMICONDUCTORS; METAL-ORGANIC; NI FILMS; REPRODUCIBILITIES; SCHOTTKY; SCHOTTKY DIODES; THERMAL OXIDATION;

EID: 84857206972     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3684625     Document Type: Article
Times cited : (41)

References (17)
  • 1
    • 77952867711 scopus 로고    scopus 로고
    • edited by F. Ren and J. C. Zolper (World Scientific, Singapore).
    • Wide Band Gap Electronic Devices, edited by, F. Ren, and, J. C. Zolper, (World Scientific, Singapore, 2003).
    • (2003) Wide Band Gap Electronic Devices
  • 8
    • 20844439094 scopus 로고    scopus 로고
    • Characterization of sputtered NiO thin films
    • DOI 10.1016/j.surfcoat.2004.10.032, PII S0257897204010229
    • H.-L. Chen, Y.-M. Lu, and W.-S. Hwang, Surf. Coat. Technol. 198, 138 (2005). 10.1016/j.surfcoat.2004.10.032 (Pubitemid 40864538)
    • (2005) Surface and Coatings Technology , vol.198 , Issue.1-3 SPEC. ISS. , pp. 138-142
    • Chen, H.-L.1    Lu, Y.-M.2    Hwang, W.-S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.