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Applied Physics A: Materials Science and Processing

Volumn 109, Issue 1, 2012, Pages 1-4

Nitride memristors

(8) Choi, Byung Joon a Yang, J Joshua a Zhang, M X a Norris, Kate J b Ohlberg, Douglas A A a Kobayashi, Nobuhiko P b Medeiros Ribeiro, Gilberto a Williams, R Stanley a

a HEWLETT PACKARD LABORATORIES (United States)

b UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALN FILMS; MATERIAL SYSTEMS; MATERIALS CHARACTERIZATION;

ATOMIC LAYER DEPOSITION; MEMRISTORS; PASSIVE FILTERS; PLATINUM; RESISTORS; TITANIUM NITRIDE;

ALUMINUM NITRIDE;

EID: 84866680779 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-012-7052-x Document Type: Article

Times cited : (62)

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