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Volumn 54, Issue 23, 1996, Pages 16676-16682

Ab initio study of oxygen point defects in GaAs, GaN, and AlN

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[No Author keywords available]

Indexed keywords


EID: 0001666951     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.16676     Document Type: Article
Times cited : (300)

References (40)
  • 12
    • 33646656867 scopus 로고
    • Our pseudopotentials are verified to be ghost-free using the method by X. Gonze, R. Stumpf and M. Scheffler, Phys. Rev. B 44, 8503 (1991).
    • (1991) Phys. Rev. B , vol.44 , pp. 8503
    • Gonze, X.1    Stumpf, R.2    Scheffler, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.