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Volumn 54, Issue 23, 1996, Pages 16676-16682
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Ab initio study of oxygen point defects in GaAs, GaN, and AlN
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001666951
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.54.16676 Document Type: Article |
Times cited : (300)
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References (40)
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