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Volumn 109, Issue 1, 2011, Pages

Distorted wurtzite unit cells: Determination of lattice parameters of nonpolar a-plane AlGaN and estimation of solid phase Al content

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE; AL CONTENT; ALGAN; ANISOTROPIC STRAIN; APPROXIMATE EXPRESSIONS; HIGH RESOLUTION X RAY DIFFRACTION; IN-PLANE STRAINS; LATTICE DISTORTIONS; LATTICE PARAMETERS; M-PLANE; NON-POLAR; NONPOLAR GROUPS; SOLID-PHASE; THERMAL MISMATCH; UNIT CELLS; WURTZITES;

EID: 78751523551     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3525602     Document Type: Article
Times cited : (52)

References (16)
  • 16
    • 78751472826 scopus 로고    scopus 로고
    • High-resolution X-ray diffraction investigations of the microstructure of MOVPE grown a-plane AlGaN epilayers, in press
    • M. R. Laskar, T. Ganguli, N. Hatui, A. A. Rahman, M. R. Gokhale, and A. Bhattacharya, "High-resolution X-ray diffraction investigations of the microstructure of MOVPE grown a-plane AlGaN epilayers," J. Cryst. Growth (in press).
    • J. Cryst. Growth
    • Laskar, R.M.1    Ganguli, T.2    Hatui, N.3    Rahman, A.A.4    Gokhale, R.M.5    Bhattacharya, A.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.