Cross-sectional imaging of individual layers and buried interfaces of graphene-based heterostructures and superlattices

Nature Materials

Volumn 11, Issue 9, 2012, Pages 764-767

  Haigh, S J ^a   Gholinia, A ^a   Jalil, R ^a   Romani, S ^b   Britnell, L ^a   Elias, D C ^a   Novoselov, K S ^a   Ponomarenko, L A ^a   Geim, A K ^a   Gorbachev, R ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BORON NITRIDE; CRYSTALS; ELECTRONIC PROPERTIES; HETEROJUNCTIONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HYDROCARBONS; IMAGE RECONSTRUCTION; INTERFACES (MATERIALS); NITRIDES; TRANSMISSION ELECTRON MICROSCOPY; VAN DER WAALS FORCES;

ATOMIC-RESOLUTION IMAGING; ATOMICALLY SHARP INTERFACE; CROSS-SECTIONAL IMAGING; CROSS-SECTIONAL TEM; INTERFACE ROUGHNESS; MULTILAYER HETEROSTRUCTURES; TWO DIMENSIONAL (2 D); VAN DER WAALS INTERACTIONS;

GRAPHENE;

EID: 84866379080     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat3386     Document Type: Article

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