Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

Journal of Materials Science Letters

Volumn 20, Issue 13, 2001, Pages 1181-1183

  Rubanov, S ^a   Munroe, P R ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION ELECTRON MICROSCOPY; ION BEAMS; IRRADIATION; POLYCRYSTALLINE MATERIALS; RECRYSTALLIZATION (METALLURGY); SPECIMEN PREPARATION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

DAMAGE LAYERS; FOCUSSED ION BEAM (FIB);

AMORPHOUS MATERIALS;

EID: 0035388519     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010950201525     Document Type: Article

References (7)