Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers

Review of Scientific Instruments

Volumn 81, Issue 7, 2010, Pages

  Nørrelykke, Simon F ^a   Flyvbjerg, Henrik ^b  

^a PRINCETON UNIVERSITY   (United States)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ALIASING; ANALYTICAL RESULTS; ATOMIC FORCE MICROSCOPE CANTILEVERS; BROWNIAN MOTION; CELL MIGRATION; CHARACTERISTIC FREQUENCIES; DIFFUSION COEFFICIENTS; ERROR BARS; FITTED VALUES; LEAST SQUARE; LENGTH SCALE; MULTIPLICATIVE FACTORS; ORNSTEIN-UHLENBECK; PARAMETER VALUES; POWER-SPECTRA; SELF-INTERACTIONS; SPECTRAL VALUE; SPRING CONSTANTS; SYNTHETIC DATA; WEIGHTED LEAST SQUARES; WEIGHTING SCHEME;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; BROWNIAN MOVEMENT; CALIBRATION; CYTOLOGY; DIFFERENTIAL EQUATIONS; DIFFUSION; NANOCANTILEVERS; OPTICAL INSTRUMENTS; POWER SPECTRUM; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS;

OPTICAL TWEEZERS;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; DIFFUSION; INSTRUMENTATION; METHODOLOGY; OPTICAL TWEEZERS; REGRESSION ANALYSIS; SPECTROSCOPY;

CALIBRATION; DIFFUSION; LEAST-SQUARES ANALYSIS; MICROSCOPY, ATOMIC FORCE; OPTICAL TWEEZERS; SPECTRUM ANALYSIS;

EID: 77957166880     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3455217     Document Type: Article

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