Static and dynamic profiles of tethered polymer layers probed by analyzing the noise of an atomic force microscope

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 56, Issue 3, 1997, Pages 3256-3264

  Roters, Andreas ^a   Gelbert, Martin ^a   Schimmel, Martin ^a   Rühe, Jürgen ^a   Johannsmann, Diethelm ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000666409     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.56.3256     Document Type: Article

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