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Volumn 64, Issue , 2013, Pages 31-37

Edge chipping of silicon wafers in diamond grinding

Author keywords

Diamond grinding; Edge chipping; Silicon wafer; Wafer thinning

Indexed keywords

CRITICAL THICKNESS; CRYSTALLOGRAPHIC ORIENTATIONS; DIAMOND GRINDING; EDGE CHIPPING; FEED-RATES; GRINDING PROCESS; GRIT SIZE; MACHINING MECHANICS; MACHINING TECHNIQUES; WAFER THINNING;

EID: 84865658020     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijmachtools.2012.08.002     Document Type: Article
Times cited : (58)

References (15)
  • 1
    • 0034956314 scopus 로고    scopus 로고
    • Development of single step grinding system for large scale Φ300 Si wafer: A total integrated fixed-abrasive solution
    • H. Eda, L. Zhou, H. Nakano, R. Kondo, J. Shimizu, and T. Nagao Development of single step grinding system for large scale Φ300 Si wafer: a total integrated fixed-abrasive solution CIRPP Annals - Manufacturing Technology 50 2001 225 228
    • (2001) CIRPP Annals - Manufacturing Technology , vol.50 , pp. 225-228
    • Eda, H.1    Zhou, L.2    Nakano, H.3    Kondo, R.4    Shimizu, J.5    Nagao, T.6
  • 2
    • 0037063909 scopus 로고    scopus 로고
    • State-of-the-art technologies and kinematical analysis for one-stop finishing of Φ300 mm Si wafer
    • L.B. Zhou, H. Eda, and J. Shimizu State-of-the-art technologies and kinematical analysis for one-stop finishing of Φ300 mm Si wafer Journal of Materials Processing Technology 129 2002 34 40
    • (2002) Journal of Materials Processing Technology , vol.129 , pp. 34-40
    • Zhou, L.B.1    Eda, H.2    Shimizu, J.3
  • 8
    • 78650930569 scopus 로고    scopus 로고
    • Study on the subsurface damage distribution of the silicon wafer ground by diamond wheel
    • S. Gao, R.K. Kang, D.M. Guo, and Q.S. Huang Study on the subsurface damage distribution of the silicon wafer ground by diamond wheel Advanced Materials Research 126 2010 113 118
    • (2010) Advanced Materials Research , vol.126 , pp. 113-118
    • Gao, S.1    Kang, R.K.2    Guo, D.M.3    Huang, Q.S.4
  • 9
    • 0037395696 scopus 로고    scopus 로고
    • Study of damage and stress induced by backgrinding in Si wafers
    • C. Jian, and I. De Wolf Study of damage and stress induced by backgrinding in Si wafers Semiconductor Science and Technology 18 2003 261 268
    • (2003) Semiconductor Science and Technology , vol.18 , pp. 261-268
    • Jian, C.1    De Wolf, I.2
  • 12
    • 80053348477 scopus 로고    scopus 로고
    • Finite element analysis of deflection and residual stress on machined ultra-thin silicon wafers
    • Y.B. Tian, L. Zhou, Z.W. Zhong, H. Sato, and J. Shimizu Finite element analysis of deflection and residual stress on machined ultra-thin silicon wafers Semiconductor Science and Technology 26 2011 105002 105008
    • (2011) Semiconductor Science and Technology , vol.26 , pp. 105002-105008
    • Tian, Y.B.1    Zhou, L.2    Zhong, Z.W.3    Sato, H.4    Shimizu, J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.