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Volumn 42, Issue 3, 2002, Pages 395-404

Fine grinding of silicon wafers: Designed experiments

Author keywords

Ceramic machining; Grinding; Grinding force; Grinding marks; Material removal; Semiconductor materials; Silicon wafers; Surface roughness

Indexed keywords

COST EFFECTIVENESS; ROTATION; SILICON WAFERS; SURFACE ROUGHNESS;

EID: 0036467803     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0890-6955(01)00123-7     Document Type: Article
Times cited : (91)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.