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Volumn 42, Issue 3, 2002, Pages 395-404
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Fine grinding of silicon wafers: Designed experiments
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Author keywords
Ceramic machining; Grinding; Grinding force; Grinding marks; Material removal; Semiconductor materials; Silicon wafers; Surface roughness
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Indexed keywords
COST EFFECTIVENESS;
ROTATION;
SILICON WAFERS;
SURFACE ROUGHNESS;
FINE GRINDING;
GRINDING (MACHINING);
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EID: 0036467803
PISSN: 08906955
EISSN: None
Source Type: Journal
DOI: 10.1016/S0890-6955(01)00123-7 Document Type: Article |
Times cited : (91)
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References (7)
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