Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope

Micron

Volumn 43, Issue 11, 2012, Pages 1108-1120

  LaGrange, Thomas ^a   Reed, Bryan W ^a   Santala, Melissa K ^a   McKeown, Joseph T ^a   Kulovits, Andreas ^b   Wiezorek, Jörg M K ^b   Nikolova, Liliya ^c   Rosei, Federico ^c   Siwick, Bradely J ^d   Campbell, Geoffrey H ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b University of Pittsburgh   (United States)

^c INRS EMT   (Canada)

^d MCGILL UNIVERSITY   (Canada)

Author keywords

Amorphous Ge; NiTi; Phase transformations; Solidification; Ultrafast electron microscopy

Indexed keywords

ATOMIC RESOLUTION; ELECTRON PROBE; ELECTRONIC PHASE TRANSITION; EXPERIMENTAL PLATFORM; FEMTOSECOND TIME SCALE; HIGH-TIME RESOLUTION; IN-SITU TECHNIQUES; MATERIALS PROCESS; MATERIALS SYSTEMS; NITI; OPERATING PRINCIPLES; PHOTOEMISSION PROCESS; PULSED-LASER SYSTEMS; PUMP-PROBE; REPETITION RATE; SINGLE-SHOT; SPATIAL RESOLUTION; TEMPORAL RESOLUTION; TIME RESOLUTION; TIME-RESOLVED; TRANSIENT EVENTS; TRANSIENT PROCESS; TRANSMISSION ELECTRON MICROSCOPE; ULTRA-FAST; ULTRAFAST ELECTRON MICROSCOPY; ULTRAFAST IMAGING;

ELECTRON MICROSCOPES; ELECTRON-ELECTRON INTERACTIONS; GERMANIUM; OPTICAL PUMPING; PHASE TRANSITIONS; PROBES; SOLIDIFICATION; TRANSMISSION ELECTRON MICROSCOPY;

MATERIALS;

EID: 84864803584     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2012.04.010     Document Type: Article

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