Quantifying transient states in materials with the dynamic transmission electron microscope

Journal of Electron Microscopy

Volumn 59, Issue SUPPL. 1, 2010, Pages

  Campbell, Geoffrey H ^a   Lagrange, Thomas ^a   Kim, Judy S ^b   Reed, Bryan W ^a   Browning, Nigel D ^a,c  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c University of California   (United States)

Author keywords

in situ microscopy; kinetics; phase transformations; reaction front morphology; reactive multilayers; time resolved microscopy

Indexed keywords

ELECTRONS; MARTENSITIC TRANSFORMATIONS; MULTILAYERS; PULSED LASERS; REACTION KINETICS;

EXPOSURE-TIME; FRONT MORPHOLOGY; IMAGING EXPERIMENTS; IN-SITU MICROSCOPIES; PHASES TRANSFORMATION; REACTION FRONT; REACTION FRONT MORPHOLOGY; REACTIVE MULTILAYER; TIME RESOLVED MICROSCOPY; TRANSMISSION ELECTRON;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 77955545927     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfq032     Document Type: Conference Paper

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