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Materials Science and Engineering: A

Volumn 314, Issue 1-2, 2001, Pages 157-161

In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics

(3) Tan, Xiaoli a Xu, Zhengkui a Shang, Jian Ku a

a University of Illinois at Urbana Champaign (United States)

Author keywords

Domain switching; Ferroelectric ceramics; In situ TEM; Microcrack; PZT

Indexed keywords

ELECTRIC FIELD EFFECTS; FATIGUE OF MATERIALS; GRAIN BOUNDARIES; MICROCRACKS; THERMAL CYCLING; TRANSMISSION ELECTRON MICROSCOPY;

DOMAIN SWITCHING; ELECTRIC FATIGUE;

FERROELECTRIC CERAMICS;

CERAMICS; ELECTRIC FIELD; ELECTRON MICROSCOPY; FATIGUE; MICROCRACK;

EID: 0035885486 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5093(00)01911-0 Document Type: Article

Times cited : (31)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.