Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy

Journal of Physics Condensed Matter

Volumn 24, Issue 31, 2012, Pages

  Koch, S ^a   Langer, M ^a   Kawai, S ^a   Meyer, E ^a   Glatzel, Th ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT MEASUREMENT; FORCE SPECTROSCOPY; HEXAGONAL BORON NITRIDE (H-BN); HIGH RESOLUTION; KELVIN PROBE FORCE MICROSCOPY; LOCAL INFORMATION; LOCAL WORK FUNCTION; MECHANICAL AND ELECTRICAL PROPERTIES; METAL CLUSTER; MODEL SYSTEM; NANOMESH; NONCONTACT ATOMIC FORCE MICROSCOPY; SPECTROSCOPY MEASUREMENTS; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; MECHANICAL PROPERTIES; MONOLAYERS; PHOTOELECTRON SPECTROSCOPY; PROBES; RHODIUM; RHODIUM COMPOUNDS; SCANNING TUNNELING MICROSCOPY; TRANSITION METALS;

BORON NITRIDE;

EID: 84864201041     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/31/314212     Document Type: Article

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