Contrast inversion in non-contact atomic force microscopy imaging of C 60 molecules

Nanotechnology

Volumn 20, Issue 26, 2009, Pages

  Loske, Felix ^a   Rahe, Philipp ^a   Kühnle, Angelika ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGING; CROSSING POINT; FREQUENCY SHIFT; MOLECULAR CONTRAST; MOLECULAR POSITION; MORSE POTENTIALS; NONCONTACT ATOMIC FORCE MICROSCOPY; RUTILE TIO; SIMULATION STUDIES; TIP-SAMPLE DISTANCE;

ATOMS; GRAPH THEORY; OXIDE MINERALS; TITANIUM OXIDES;

ATOMIC FORCE MICROSCOPY;

CARBON; TITANIUM DIOXIDE; FULLERENE C60; FULLERENE DERIVATIVE; NANOMATERIAL; TITANIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTRAST ENHANCEMENT; CONTROLLED STUDY; FREQUENCY MODULATION; MOLECULAR DYNAMICS; MOLECULAR IMAGING; MOLECULAR INTERACTION; PRIORITY JOURNAL; REPRODUCIBILITY; SIMULATION; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; METHODOLOGY; ULTRASTRUCTURE;

COMPUTER SIMULATION; FULLERENES; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; NANOSTRUCTURES; TITANIUM;

EID: 67649383356     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/26/264010     Document Type: Article

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