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Volumn 202, Issue 1, 2005, Pages 37-45

Atomic force microscopy study of hexagonal boron nitride film growth on 6H-SiC (0001)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC ENERGY; HEXAGONAL BORON NITRIDE FILMS; PLASMA-EXCITED BORAZINE; WETTING PROPERTIES;

ATOMIC FORCE MICROSCOPY; BUCKLING; COMPOSITION; ELASTICITY; MORPHOLOGY; SILICON CARBIDE; THIN FILMS; WETTING;

BORON COMPOUNDS;

EID: 25444528465 PISSN: 18626300 EISSN: 18626319 Source Type: Journal
DOI: 10.1002/pssa.200406909 Document Type: Article

Times cited : (4)

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