Combining internal probing with artificial neural networks for optimal RFIC testing

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Ellouz, Sofiane ^a   Gamand, Patrice ^a   Kelma, Christophe ^a   Vandewiele, Bertrand ^b   Allard, Bruno ^c  

^a NXP SEMICONDUCTORS   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c Univ Claude Bernard Lyon1   (France)

Author keywords

Analog test; Classifier; DC probes; DC RF correlation; DfT (Design for Test); Diagnostic; Known Good Die (KGD); Neural network; Pattern recognition; RF test; Signatures; WLAN transceiver

Indexed keywords

COST REDUCTION; DESIGN FOR TESTABILITY; ELECTRONIC EQUIPMENT; NETWORKS (CIRCUITS); PARAMETER ESTIMATION; PATTERN RECOGNITION;

ANALOG TEST; ASSEMBLED SYSTEMS; AUTOMATED TEST EQUIPMENTS (ATE); DC-RF CORRELATION; PRODUCTION COSTS; WLAN TRANSCEIVER;

NEURAL NETWORKS;

EID: 39749113131     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297705     Document Type: Conference Paper

References (12)