Computational intelligence based testing for semiconductor measurement systems

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 906-915

  Liau, Eric ^a   Schmitt Landsiedel, Doris ^b  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; AUTOMATIC TESTING; DESIGN FOR TESTABILITY; FUNCTION EVALUATION; GENETIC ALGORITHMS;

AUTOMATIC TEST EQUIPMENT (ATE); DEVICE UNDER TEST (DUT); DIAGNOSTIC STRATEGY; FAULT PREDICTION; TEST CONDITIONS;

SEMICONDUCTOR DEVICE TESTING;

EID: 33847131361     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584056     Document Type: Conference Paper

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