Mimicking of functional state space with structural tests for the diagnosis of board-level functional failures

Proceedings of the Asian Test Symposium

Volumn , Issue , 2010, Pages 421-428

  Fang, Hongxia ^a   Wang, Zhiyuan ^b   Gu, Xinli ^b   Chakrabarty, Krishnendu ^a  

^a DUKE UNIVERSITY   (United States)

^b CISCO SYSTEMS   (United States)

Author keywords

coverage; Board level diagnosis; Functional failure; Functional scan; Functional state space

Indexed keywords

AUTOMATIC TEST EQUIPMENT; BOARD-LEVEL; COVERAGE METRICS; FUNCTIONAL FAILURE; FUNCTIONAL SCAN; FUNCTIONAL STATE; FUNCTIONAL TEST; INITIAL STATE; INJECTION TECHNIQUES; LINEAR TIME; NO TROUBLE FOUND; RANDOM METHODS; ROOT CAUSE; SCAN TESTS; STRUCTURAL TESTS;

AUTOMATIC TESTING;

EID: 79951652837     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2010.78     Document Type: Conference Paper

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