Bayesian fault diagnosis in large-scale measurement systems

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2004, Pages 1234-1239

  Barford, Lee ^a   Kanevsky, Valery ^a   Kamas, Linda ^b  

^a AGILENT LABORATORIES   (United States)

^b NONE

Author keywords

Analog system fault diagnosis; Diagnostic expert systems; Digital system fault diagnosis; Fault diagnosis; Measurement system data handling

Indexed keywords

ANALOG SYSTEMS; DIAGNOSTIC EXPERT SYSTEMS; DIGITAL SYSTEMS; FAULT DIAGNOSIS; SUBSYSTEMS;

COMPUTER SOFTWARE; DATA REDUCTION; EXPERT SYSTEMS; LIFE CYCLE; PHOTONS; SENSORS;

LARGE SCALE SYSTEMS;

EID: 4644336433     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2004.1351288     Document Type: Conference Paper

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