Measurement of shear strength for HOPG with scanning tunneling microscopy by thermal excitation method

Ultramicroscopy

Volumn 115, Issue , 2012, Pages 1-6

  Ding, X D ^a   Wang, Y Z ^a   Xiong, X M ^a   Du, X S ^a   Zhang, J X ^a  

^a SUN YAT SEN UNIVERSITY   (China)

Author keywords

Highly oriented pyrolytic graphite; Scanning tunneling microscopy; Shear strength; Thermal excitation

Indexed keywords

ACCURATE MEASUREMENT; AFM; ATOMIC SCALE; ELASTIC THEORY; EXPERIMENTAL OBSERVATION; FORCE GRADIENTS; FORCE INTERACTION; HIGHLY ORIENTED PYROLYTIC GRAPHITE; SHORT-RANGE FORCES; SPECTRA ANALYSIS; THERMAL EXCITATION; THERMAL FLUCTUATIONS; TUNNELING CURRENT;

ATOMIC FORCE MICROSCOPY; GRAPHITE; PROBES; SHEAR STRENGTH;

SCANNING TUNNELING MICROSCOPY;

GRAPHITE; HIGHLY ORIENTED PYROLYTIC GRAPHITE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPRESSION; ELASTICITY; FORCE; MECHANICS; SCANNING TUNNELING MICROSCOPY; SHEAR STRENGTH; SHEAR STRESS; SPECTROSCOPY; VIBRATION;

EID: 84862779079     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.01.018     Document Type: Article

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