-
1
-
-
0033153911
-
-
SSREDI 0167-5729. 10.1016/S0167-5729(99)00003-5
-
B. Cappella and G. Dietler, Surf. Sci. Rep. SSREDI 0167-5729 34, 1 (1999). 10.1016/S0167-5729(99)00003-5
-
(1999)
Surf. Sci. Rep.
, vol.34
, pp. 1
-
-
Cappella, B.1
Dietler, G.2
-
2
-
-
27744587245
-
-
SSREDI 0167-5729. 10.1016/j.surfre2005.08.003
-
H. J. Butt, B. Cappella, and M. Kappl, Surf. Sci. Rep. SSREDI 0167-5729 59, 1 (2005). 10.1016/j.surfrep.2005.08.003
-
(2005)
Surf. Sci. Rep.
, vol.59
, pp. 1
-
-
Butt, H.J.1
Cappella, B.2
Kappl, M.3
-
4
-
-
0038981463
-
-
JAPIAU 0021-8979. 10.1063/1.347347
-
T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. JAPIAU 0021-8979 69, 668 (1991). 10.1063/1.347347
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 668
-
-
Albrecht, T.R.1
Grütter, P.2
Horne, D.3
Rugar, D.4
-
5
-
-
0032121114
-
-
LANGD5 0743-7463. 10.1021/la971409d
-
A. Roters, M. Schimmel, J. Rühe, and D. Johannsmann, Langmuir LANGD5 0743-7463 14, 3999 (1998). 10.1021/la971409d
-
(1998)
Langmuir
, vol.14
, pp. 3999
-
-
Roters, A.1
Schimmel, M.2
Rühe, J.3
Johannsmann, D.4
-
7
-
-
0001527890
-
-
APPLAB 0003-6951. 10.1063/1.126527
-
D. O. Koralek, W. F. Heintz, M. D. Antonik, A. Baik, and J. H. Hoh, Appl. Phys. Lett. APPLAB 0003-6951 76, 2952 (2000). 10.1063/1.126527
-
(2000)
Appl. Phys. Lett.
, vol.76
, pp. 2952
-
-
Koralek, D.O.1
Heintz, W.F.2
Antonik, M.D.3
Baik, A.4
Hoh, J.H.5
-
8
-
-
0033747153
-
-
LANGD5 0743-7463. 10.1021/la991368g
-
O. H. Willemsen, L. Kuipers, K. O. van der Werf, B. G. de Grooth, and J. Greve, Langmuir LANGD5 0743-7463 16, 4339 (2000). 10.1021/la991368g
-
(2000)
Langmuir
, vol.16
, pp. 4339
-
-
Willemsen, O.H.1
Kuipers, L.2
Van Der Werf, K.O.3
De Grooth, B.G.4
Greve, J.5
-
9
-
-
85067716511
-
-
A.P.E. Research, Trieste (www.aperesearch.com)
-
A.P.E. Research, Trieste (www.aperesearch.com).
-
-
-
-
10
-
-
4544257551
-
-
NNOTER 0957-4484. 10.1088/0957-4484/15/9/039
-
R. Proksch, T. E. Schäffer, J. P. Cleveland, R. C. Callahan, and M. B. Viani, Nanotechnology NNOTER 0957-4484 15, 1344 (2004). 10.1088/0957-4484/15/ 9/039
-
(2004)
Nanotechnology
, vol.15
, pp. 1344
-
-
Proksch, R.1
Schäffer, T.E.2
Cleveland, J.P.3
Callahan, R.C.4
Viani, M.B.5
-
12
-
-
34347209835
-
-
NNOTER 0957-4484. 10.1088/0957-4484/6/1/001
-
H. J. Butt and M. Jaschke, Nanotechnology NNOTER 0957-4484 6, 1 (1995). 10.1088/0957-4484/6/1/001
-
(1995)
Nanotechnology
, vol.6
, pp. 1
-
-
Butt, H.J.1
Jaschke, M.2
-
13
-
-
0036472312
-
Measuring the spring constant of atomic force microscope cantilevers: Thermal fluctuations and other methods
-
DOI 10.1088/0957-4484/13/1/307, PII S0957448402275984
-
R. Ĺvy and M. Maaloum, Nanotechnology NNOTER 0957-4484 13, 33 (2002). 10.1088/0957-4484/13/1/307 (Pubitemid 34180677)
-
(2002)
Nanotechnology
, vol.13
, Issue.1
, pp. 33-37
-
-
Levy, R.1
Maaloum, M.2
-
14
-
-
15844400525
-
Comment on tilt of atomic force microscope cantilevers: Effect on spring constant and adhesion measurements
-
DOI 10.1021/la047670t
-
J. L. Hutter, Langmuir LANGD5 0743-7463 21, 2630 (2005). 10.1021/la047670t (Pubitemid 40421918)
-
(2005)
Langmuir
, vol.21
, Issue.6
, pp. 2630-2632
-
-
Hutter, J.L.1
-
15
-
-
34548612517
-
-
(The Russian Academy of Science-Institute for Physics of Microstructures, Nizhniy Novgorod, Russia)
-
V. L. Mironov, Fundamentals of Scanning Probe Microscopy (The Russian Academy of Science-Institute for Physics of Microstructures, Nizhniy Novgorod, Russia, 2004).
-
(2004)
Fundamentals of Scanning Probe Microscopy
-
-
Mironov, V.L.1
-
16
-
-
0141990921
-
Advances in atomic force microscopy
-
DOI 10.1103/RevModPhys.75.949
-
F. J. Giessibl, Rev. Mod. Phys. RMPHAT 0034-6861 75, 949 (2003). 10.1103/RevModPhys.75.949 (Pubitemid 37249573)
-
(2003)
Reviews of Modern Physics
, vol.75
, Issue.3
, pp. 949-983
-
-
Giessibl, F.J.1
-
17
-
-
0000428132
-
-
PRBMDO 0163-1829. 10.1103/PhysRevB.56.16010
-
F. J. Giessibl, Phys. Rev. B PRBMDO 0163-1829 56, 16010 (1997). 10.1103/PhysRevB.56.16010
-
(1997)
Phys. Rev. B
, vol.56
, pp. 16010
-
-
Giessibl, F.J.1
-
18
-
-
34548455960
-
Dynamic force spectroscopy using cantilever higher flexural modes
-
DOI 10.1063/1.2775806
-
Y. Sugimoto, S. Innami, M. Abe, O. Custance, and S. Morita, Appl. Phys. Lett. APPLAB 0003-6951 91, 093120 (2007). 10.1063/1.2775806 (Pubitemid 47352350)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.9
, pp. 093120
-
-
Sugimoto, Y.1
Innami, S.2
Abe, M.3
Custance, O.4
Morita, S.5
-
21
-
-
0037259343
-
-
NNOTER 0957-4484. 10.1088/0957-4484/14/1/301
-
N. A. Burnham, X. Chen, C. S. Hodges, G. A. Matei, E. J. Thoreson, C. J. Roberts, M. C. Davies and S. J. B. Tendler, Nanotechnology NNOTER 0957-4484 14, 1 (2003). 10.1088/0957-4484/14/1/301
-
(2003)
Nanotechnology
, vol.14
, pp. 1
-
-
Burnham, N.A.1
Chen, X.2
Hodges, C.S.3
Matei, G.A.4
Thoreson, E.J.5
Roberts, C.J.6
Davies, M.C.7
Tendler, S.J.B.8
-
22
-
-
33749575354
-
Measuring Boltzmann's constant with a low-cost atomic force microscope: An undergraduate experiment
-
DOI 10.1119/1.2335475
-
M. Shusteff, T. P. Burg, and S. R. Manalis, Am. J. Phys. AJPIAS 0002-9505 74, 873 (2006). 10.1119/1.2335475 (Pubitemid 44534288)
-
(2006)
American Journal of Physics
, vol.74
, Issue.10
, pp. 873-879
-
-
Shusteff, M.1
Burg, T.P.2
Manalis, S.R.3
-
23
-
-
34547668637
-
Equivalent point-mass models of continuous atomic force microscope probes
-
DOI 10.1063/1.2767173
-
J. Melcher, S. Hu, and A. Raman, Appl. Phys. Lett. APPLAB 0003-6951 91, 053101 (2007). 10.1063/1.2767173 (Pubitemid 47210835)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.5
, pp. 053101
-
-
Melcher, J.1
Hu, S.2
Raman, A.3
|