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Volumn 75, Issue 8, 2004, Pages 2608-2612
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On the stability of Besocke-type scanners
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Author keywords
[No Author keywords available]
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Indexed keywords
HYSTERESIS;
NATURAL FREQUENCIES;
OPTICAL RESOLVING POWER;
OPTIMIZATION;
PIEZOELECTRIC TRANSDUCERS;
SCANNING TUNNELING MICROSCOPY;
SPECTROSCOPIC ANALYSIS;
SURFACE PLASMON RESONANCE;
ULTRAHIGH VACUUM;
VIBRATIONS (MECHANICAL);
BESOCKE-TYPE SCANNERS;
MECHANICAL RESONANCES;
PIEZOCERAMICS;
SCANNING PROBE MICROSCOPY;
OPTICAL DEVICES;
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EID: 4944228106
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1688439 Document Type: Article |
Times cited : (22)
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References (18)
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