Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback

Nanotechnology

Volumn 15, Issue 2, 2004, Pages

  Ozer, H O ^a,b   Norris, A ^b   Oral, A ^c   Hoffmann, P M ^d   Pethica, J B ^a,b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c BILKENT UNIVERSITY   (Turkey)

^d WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FORCE GRADIENT IMAGING; NONCONTACT ATOMIC FORCE MICROSCOPE; TUNNEL CURRENT FEEDBACK;

ATOMIC FORCE MICROSCOPY; COPPER; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SURFACES;

SURFACE TREATMENT;

EID: 1442312612     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/2/002     Document Type: Article

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