Experimental characterization and mitigation of specimen charging on thin films with one conducting layer

Microscopy and Microanalysis

Volumn 10, Issue 6, 2004, Pages 783-789

  Downing, Kenneth H ^a   McCartney, M R ^b   Glaeser, Robert M ^a,c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Cryomicroscopy; Electron crystallography; Specimen charging; Thin films

Indexed keywords

CARBON; PLATINUM;

CONFERENCE PAPER; CRYOELECTRON MICROSCOPY; ELECTRIC CONDUCTIVITY; FEASIBILITY STUDY; HISTOLOGY; HOLOGRAPHY; METHODOLOGY; PURPLE MEMBRANE; ULTRASTRUCTURE;

CARBON; CRYOELECTRON MICROSCOPY; ELECTRIC CONDUCTIVITY; FEASIBILITY STUDIES; HOLOGRAPHY; PLATINUM; PURPLE MEMBRANE; TISSUE EMBEDDING;

EID: 11244269506     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760404067X     Document Type: Conference Paper

References (9)

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