Convenient electron optics set up for zernike phase microscopy in TEM

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 1234-1235

  Kawasaki, Masahiro ^a   Malac, Marek ^b   Li, Peng ^b   Qian, Hui ^b   Egerton, Ray ^b  

^a JEOL USA INC   (United States)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949116468     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609094598     Document Type: Article

References (6)

1. Malac M, Beleggia M, Egerton RF, Zhu Y, Ultramicroscopy 108 (2008), 126.
2. Hosokawa et al, Journal of Electron Microscopy 54 (2005), p. 317.
3. Wang YY, Kawasaki M et al, Ultramicroscopy 101, 63.
4. Nagayama K, Danev R, US patent 20080202918 A1.
5. Chen KF et al, Micron 39 (2008), 749.
6. The support for this work was provided by NINT/NRC and by JEOL USA (M.K.).