Electron holography of thin amorphous carbon films: Measurement of the mean inner potential and a thickness-independent phase shift

Ultramicroscopy

Volumn 106, Issue 4-5, 2006, Pages 341-345

  Wanner, Matthias ^a,c   Bach, David ^a   Gerthsen, Dagmar ^a   Werner, Ralph ^a,d   Tesche, Bernd ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b MAX PLANCK INSTITUT FÜR KOHLENFORSCHUNG   (Germany)

^c UNIVERSITY OF STUTTGART   (Germany)

^d D fine GmbH   (Germany)

Author keywords

Amorphous carbon; Electron energy loss spectroscopy; Electron holography; Mean inner coulomb potential; Surface potential; Transmission electron microscopy

Indexed keywords

AMORPHOUS FILMS; ELECTRIC POTENTIAL; ELECTRON HOLOGRAPHY; ELECTROSTATICS; PHASE SHIFT; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS CARBON; ELECTRON ENERGY-LOSS SPECTROSCOPY; MEAN INNER COULOMB POTENTIAL; SURFACE POTENTIAL;

THIN FILMS;

CARBON;

ARTICLE; DENSITY; ELECTRIC POTENTIAL; ELECTRON; FILM; HOLOGRAPHY; MATHEMATICAL ANALYSIS; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33644543783     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.10.004     Document Type: Article

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