Delocalized radiation damage in polymers

Micron

Volumn 43, Issue 1, 2012, Pages 2-7

  Egerton, R F ^a   Lazar, S ^b,c   Libera, M ^d  

^a UNIVERSITY OF ALBERTA   (Canada)

^b MCMASTER UNIVERSITY   (Canada)

^c Thermo Fisher Scientific   (United States)

^d Stevens Institute of Technology   (United States)

Author keywords

Delocalization; EELS; Polymers; Radiation damage

Indexed keywords

DELOCALIZATIONS;

ELECTRON ENERGY LOSS SPECTROSCOPY; POLYSTYRENES; RADIATION DAMAGE;

POLYMERS;

EID: 84855487909     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.05.007     Document Type: Article

References (16)

1. Arayasantiparb, D., Kulhman, W., Libera, M., 2001. Dose dependence of fast secondary electron radiation effects in an aromatic epoxy. Unpublished report.
2. Cheng S.C. Localization distance of plasmons excited by high-energy electrons. Ultramicroscopy 1987, 21:291-292.
3. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope 2011, Springer, New York. 3rd edition.
4. Egerton R.F., Li P., Malac M. The lateral range and energy deposition of fast secondary electrons. Microsc. Microanal. 2004, (Suppl. 2):1382CD-1383CD.
5. Han G., Cerina F. Energy transfer between electrons and photoresist: its relation to resolution. J. Vac. Sci. Technol. B 2000, 18:3297-3302.
6. Howie A., Rocca F.J., Valdre U. Electron beam ionization damage processes in p-terphenyl. Phil. Mag. B 1985, 52(1985):751-759.
7. Joy D.C. Monte Carlo Modeling for Electron Microscopy and Microanalysis 1995, Oxford University Press, Oxford.
8. Koch E.E., Otto A. Characteristic energy losses of 30-keV electrons in vapours of aromatic hydrocarbons. Opt. Commun. 1969, 1:47-49.
9. Libera M.R., Egerton R.F. Advances in the transmission electron microscopy of polymers. Polym. Rev. 2010, 50:321-339.
10. Muller D.A., Silcox J. Delocalization in inelastic scattering. Ultramicroscopy 1995, 59:195-213.
11. Nave C., Hill M.A. Will reduced radiation damage occur with very small crystals?. J. Synchrotron Radiat. 2005, 12:299-303.
12. Parkinson G.M., Goringe M.J., Jones W., Rees W., Thomas J.M., Williams J.O. Electron induced damage in organic molecular crystals: some observations and theoretical considerations. Developments in Electron Microscopy and Analysis 1976, 315-318. Academic Press, London. J.A. Venables (Ed.).
13. Siangchaew K., Libera M. The influence of fast secondary electrons on the aromatic structure of polystyrene. Phil. Mag. A 2000, 80:1001-1016.
14. Stevens M.R., Chen Q., Weierstall U., Spence J. Transmission electron diffraction at 200eV and damage thresholds below the carbon K edge. Microsc. Microanal. 2000, 6:368-379.
15. Varlot K, Martin J.M., Quet C., Kihn Y. Towards sub-nanometer scale EELS analysis of polymers in the TEM. Ultramicroscopy 1997, 68:123-133.
16. Wu B., Neureuther A.R. Energy deposition and transfer in electron-beam lithography. J. Vac. Sci. Technol. B 2001, 19:2508-2511.