Effect of a physical phase plate on contrast transfer in an aberration-corrected transmission electron microscope

Ultramicroscopy

Volumn 108, Issue 9, 2008, Pages 878-884

  Gamm, B ^a   Schultheiss K ^a   Gerthsen, D ^a   Schroder R R ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b MAX PLANCK INSTITUTE OF BIOPHYSICS   (Germany)

Author keywords

Contrast transfer function; In focus phase contrast; Phase contrast; Phase plate; Transmission electron microscopy

Indexed keywords

ABERRATIONS; ELECTRON MICROSCOPES; OPTICAL PROPERTIES; OPTICS; SEMICONDUCTOR QUANTUM WIRES;

PHASE OBJECTS; PHASE PLATES; TRANSMISSION ELECTRON MICROSCOPE (TEM);

MICROSCOPES;

AMPLITUDE MODULATION; ARTICLE; LIGHT SCATTERING; MATHEMATICAL ANALYSIS; PHYSICAL PHASE; TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 48149104995     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.02.009     Document Type: Article

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