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Volumn 72, Issue 1-2, 1998, Pages 41-52

Evaluation of charging on macromolecules in electron cryomicroscopy

Author keywords

Cryomicroscopy; Defocused diffraction; Electrical breakdown; Imaging charged samples; Secondary electron emission; Specimen current

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMAGING TECHNIQUES; LOW TEMPERATURE PROPERTIES;

EID: 0032053733     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00126-5     Document Type: Article
Times cited : (69)

References (25)
  • 16
    • 0000458832 scopus 로고
    • J. Schou, P. Kruit, D.I. Newbury (Eds.), AMF O'Hare. Chicago
    • L.W. Hobbs, m: J. Schou, P. Kruit, D.I. Newbury (Eds.), Scanning Microsc. Suppl., vol. 4, AMF O'Hare. Chicago, 1990. p. 171.
    • (1990) Scanning Microsc. Suppl. , vol.4 , pp. 171
    • Hobbs, L.W.1
  • 17
    • 0024811116 scopus 로고
    • R.M. Albracht, R.L. Ornberg (Eds.), AMF O'llare. Chicago
    • M.K. Lamvik, S.D. Davilla, J. Tuttle, in: R.M. Albracht, R.L. Ornberg (Eds.), Scanning Microsc. Suppl., Vol. 3, AMF O'llare. Chicago. 1989. p. 271.
    • (1989) Scanning Microsc. Suppl. , vol.3 , pp. 271
    • Lamvik, M.K.1    Davilla, S.D.2    Tuttle, J.3
  • 18
    • 77954567430 scopus 로고
    • F. Seitz, D. Turnbull (Eds.), Academic Press. New York
    • A.J. Dekker, in: F. Seitz, D. Turnbull (Eds.), Solid State Physics, vol. 6. Academic Press. New York. 1958, p. 251.
    • (1958) Solid State Physics , vol.6 , pp. 251
    • Dekker, A.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.