Microscopy of pentacene thin films

Philosophical Magazine

Volumn 87, Issue 2, 2007, Pages 253-266

  Qian, H ^b   Malac, M ^b   Egerton, R F ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; SUBLIMATION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM APPLICATIONS;

CRYSTALLINITY; POST-DEPOSITION ANNEALING; RADIATION SENSITIVITY;

POLYCYCLIC AROMATIC HYDROCARBONS;

EID: 33751531566     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430600953756     Document Type: Article

References (19)

1. N. Jackson, Y.Y. Lin and D.J. Gundlach, IEEE J. Sel. Topics Quantum Electron. 4 100 (1998).
2. R. Ruiz, B. Nickel, N. Koch, et al., Phys. Rev. B 67 125406 (2003).
3. S. Verlaak, S. Steudel, P. Heremans, et al., Phys. Rev. B 68 195409 (2003).
4. S. Pratontep, M. Brinkmann, F. Nuesch, et al., Phys. Rev. B 69 165201 (2004).
5. W.J. Huang, B.Q. Li and J.M. Zuo, Surf. Sci. 595 157 (2005).
6. J.E. Northrup, M.L. Tiago and S.G. Louie, Phys. Rev. B 66 121404 (2002).
7. C.C. Mattheus, A.B. Dros, J. Baas, et al., Synth. Metals 138 475 (2003).
8. R.F. Egerton and S.C. Cheng, Ultramicroscopy 55 43 (1994).
9. L. Reimer, Transmission Electron Microscopy, 4th ed. (Springer, New York, 1997), p. 346.
10. J. Lee, J.H. Kim and S. Im, J. Appl. Phys. 95 3733 (2004).
11. R.Q. Hwang, C. Gunther, J. Schroder, et al., J. Vac. Sci. Technol. A 10 1970 (1992).
12. J.S. Langer and H. Muller-Krumbhaar, Acta Metall. 26 1681 (1978).
13. J.A. Venables, Introduction to Surface and Thin Film Processes (Cambridge University Press, Cambridge, 2000).
14. J.G. Laquindanum, H.E. Katz, A.J. Lovinger, et al., Chem. Mater. 8 2542 (1996).
15. C.D. Dimitrakopoulos and P.R.L. Malenfant, Adv. Mater. 14 99 (2002).
16. M.S. Isaacson, Principles and Techniques of Electron Microscopy, Vol. 7 (Van Nostrand, New York, 1977), pp. 1-78.
17. P. Li and R.F. Egerton, Ultramicroscopy 101 161 (2004).
18. R.S. Payne and G. Beamson, Polymer 34 1637 (1993).
19. R.F. Egerton, Physical Principles of Electron Microscopy (Springer, New York, 2005).