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Journal of Electroceramics

Volumn 27, Issue 2, 2011, Pages 66-77

Resistance variation in donor-doped PZT stacks with Cu inner electrodes under high field stress

(3) Völkl, Elmar a Hillebrand, Philipp a Fleig, Juergen a

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

Actuators; Defects; Diffusion; Electrical conductivity; PZT

Indexed keywords

CAPACITOR CHARGING; CERAMIC LAYER; DECAY TIME; DONOR DOPING; DONOR-DOPED; ELECTRICAL CONDUCTIVITY; FIELD STRESS; GAS ATMOSPHERE; HIGH FIELD; HIGH FIELD STRESS; HIGH VOLTAGE; INNER-ELECTRODES; LEAD ZIRCONATE TITANATE; OXYGEN DEFICIENCY; OXYGEN DIFFUSION COEFFICIENTS; OXYGEN MIGRATION; PZT; PZT MATERIALS; PZT MULTILAYER; PZT STACK; RESISTANCE VARIATIONS; THERMALLY ACTIVATED; TIME CONSTANTS; TIME-SCALES;

ACTIVATION ENERGY; ACTUATORS; DEFECTS; DIFFUSION; ELECTRIC CONDUCTIVITY; ELECTRODES; LEAD OXIDE; OXYGEN; SEMICONDUCTING LEAD COMPOUNDS; STOICHIOMETRY;

OXYGEN VACANCIES;

EID: 84860416950 PISSN: 13853449 EISSN: 15738663 Source Type: Journal
DOI: 10.1007/s10832-011-9651-x Document Type: Article

Times cited : (14)

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