Initial stage of silver electrochemical migration degradation

Microelectronics Reliability

Volumn 46, Issue 9-11, 2006, Pages 1915-1921

  Yang, S ^a   Wu, J ^a   Christou, A ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DENDRIMERS; ELECTRIC CONDUCTORS; ELECTRIC INSULATION; ELECTRIC RESISTANCE; ELECTROCHEMICAL CORROSION; IONS;

CONTINUOUS GENERATION; ELECTROCHEMICAL MIGRATION; SILVER IONS ACCUMULATION; SURFACE INSULATION RESISTANCE;

SILVER ALLOYS;

EID: 33747800312     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.07.080     Document Type: Article

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