Fractal description of dendrite growth during electrochemical migration

Microelectronics Reliability

Volumn 48, Issue 10, 2008, Pages 1628-1634

  Dominkovics, Csaba ^a   Harsányi, Gábor ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; DENDRITES (METALLOGRAPHY); ELECTRIC FAULT LOCATION; ELECTRIC WIRING; FAILURE ANALYSIS; FRACTALS; INITIATORS (CHEMICAL); NEURONS; OFFSHORE OIL WELL PRODUCTION; OPTICAL TESTING; PRINTED CIRCUIT BOARDS; QUALITY ASSURANCE; SAFETY FACTOR; SOLDERED JOINTS;

DENDRITE GROWTH; ELECTRO-CHEMICAL MIGRATION; FRACTAL DESCRIPTION;

FRACTAL DIMENSION;

EID: 50949090113     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2008.06.010     Document Type: Review

References (14)

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